Oxide Reliability: A Summary Of Silicon Oxide Wearout, Breakdown, And Reliability

Artikelnummer: 978-981-02-4842-0
Einband: Fester Einband
Verfügbarkeit: Lieferbar in ca. 10-20 Arbeitstagen
CHF 176.00
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This book presents in summary the state of our knowledge of oxide reliability. The articles have been written by experts who are among the most knowledgeable in the field. The book will be an invaluable aid to reliability engineers and manufacturing engineers, helping them to produce and characterize reliable oxides. It can be used as an introduction for new engineers interested in oxide reliability, besides being a reference for engineers already engaged in the field

This book presents in summary the state of our knowledge of oxide reliability. The articles have been written by experts who are among the most knowledgeable in the field. The book will be an invaluable aid to reliability engineers and manufacturing engineers, helping them to produce and characterize reliable oxides. It can be used as an introduction for new engineers interested in oxide reliability, besides being a reference for engineers already engaged in the field

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VerlagWorld Scientific Publishing
EinbandFester Einband
Erscheinungsjahr2002
Seitenangabe344 S.
AusgabekennzeichenEnglisch
CoverlagWorld Scientific Publishing Co Pte Ltd (Imprint/Brand)
ReiheSelected Topics in Electronics and Systems
AutorD J Dumin (Hrsg.)

Alle Bände der Reihe "Selected Topics in Electronics and Systems"

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