Defects and Synchrotron X-Ray Topography in Silicone-Carbide Based Devices (eBook)

Bild von Defects and Synchrotron X-Ray Topography in Silicone-Carbide Based Devices (eBook)

Artikelnummer: 978-3-0364-1332-7

Einband: PDF

Verfügbarkeit: Download, sofort verfügbar (Link per E-Mail)

CHF 172.55

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The presented special edition is devoted to the latest research in semiconductor materials and devices on silicon carbide and the design and research of machines and equipment. This issue will be helpful to specialists engaged in the design and production of power electronics and to mechanical engineers.

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The presented special edition is devoted to the latest research in semiconductor materials and devices on silicon carbide and the design and research of machines and equipment. This issue will be helpful to specialists engaged in the design and production of power electronics and to mechanical engineers.

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Verlag	Trans Tech Publications
Einband	PDF
Erscheinungsjahr	2023
Seitenangabe	152 S.
Ausgabekennzeichen	Englisch
Masse	35'798 KB
Plattform	PDF
Autor	Marek, Juraj (Hrsg.) / Pobegen, Gregor (Hrsg.) / Grossner, Ulrike (Hrsg.)

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